tests/test-exp-ieee.h

   1 /* Test of exp*() function family.
   2    Copyright (C) 2012-2024 Free Software Foundation, Inc.
   3
   4    This program is free software: you can redistribute it and/or modify
   5    it under the terms of the GNU General Public License as published by
   6    the Free Software Foundation, either version 3 of the License, or
   7    (at your option) any later version.
   8
   9    This program is distributed in the hope that it will be useful,
  10    but WITHOUT ANY WARRANTY; without even the implied warranty of
  11    MERCHANTABILITY or FITNESS FOR A PARTICULAR PURPOSE.  See the
  12    GNU General Public License for more details.
  13
  14    You should have received a copy of the GNU General Public License
  15    along with this program.  If not, see <https://www.gnu.org/licenses/>.  */
  16
  17 static void
  18 test_function (void)
  19 {
  20   /* [MX] shaded specification in POSIX.  */
  21
  22   /* Underflow.  */
  23   {
  24     volatile DOUBLE z = EXP (-100000.0);
  25     ASSERT (z == L_(0.0));
  26     ASSERT (!signbit (z));
  27   }
  28
  29   /* NaN.  */
  30   ASSERT (ISNAN (EXP (NAN)));
  31
  32   /* Zero.  */
  33   ASSERT (EXP (L_(0.0)) == L_(1.0));
  34   ASSERT (EXP (MINUS_ZERO) == L_(1.0));
  35
  36   /* Infinity.  */
  37   {
  38     DOUBLE z = EXP (- INFINITY);
  39     ASSERT (z == L_(0.0));
  40     ASSERT (!signbit (z));
  41   }
  42   ASSERT (EXP (INFINITY) == INFINITY);
  43 }